NIR Camera
InGaAs Camera
The C12741-03 InGaAs Camera can be used for infrared microscope imaging to observe internal defects of Silicon wafer (such as chipping & cracks, EOS burn traces on circuitry and MEMS (bonded wafer) alignment.
Low noise and high stability Forced Air Cooled (Peltier) Sensor : +10°C
Pixels No: 640 (H). x 512 (V)
Spectral response : 900nm ~ 1700nm
Interface Port : Analog (EIA) , USB 3.0
C12741-03
InGaAs Camera
ORCA-Flash 4.0V3
The C13440-20CU sCMOS Camera can be used for infrared microscope imaging to observe internal defects of Silicon wafer (such as chipping & cracks, EOS burn traces on circuitry and MEMS (bonded wafer) alignment.
Low Readout Noise and Dark Current
Pixels No: 2048 (H). x 2048 (V)
Binning : 2×2, 4×4
Spectral response : 400nm ~ 1000nm
Interface Port : USB 3.0 and Camera Link
C13440-20CU
sCMOS Camera
